FEIT Research Project Database

Quantum material characterisation by scanning tunnelling microscope imaging

Project Leader: M Usman
Primary Contact: M Usman (muhammad.usman@unimelb.edu.au)
Keywords: nanoelectronics; nanotechnology
Disciplines: Electrical & Electronic Engineering

Scanning Tunnelling Microscope (STM) is a versatile tool which has been extensively used to charatcerise nanoscale materials and nanoelectronic devices with atomic resolution. In this project, the student will theoretically simulate STM images with particular emphasis on the characterisation of spin qubits in silicon. The knowledge developed in this project will be highly valuable for the design of two qubit quantum gates and large-scale quantum computing architectures.


M. Usman et al, Nature Nanotechnology 11, 763-768, (2016)

M. Usman et al, Nanoscale 9, 17013, (2017)

M. Usman et al, https://arxiv.org/abs/1904.01756